InZiv manufactures high-resolution testing and inspection equipment for today's most advanced microLED displays. With pixels currently being developed on a scale as small as single-microns, only the highest resolution techniques – down to the nanoscale – can meet today’s most rigorous characterization demands. For metrology testing, map whole wafers with PL and AOI, and then analyze individual pixels using nano-PL, electroluminescence (EL), and nano-EL for a comprehensive analysis of the pixel features, including EQE and angular distribution measurements. And for high-throughput EL inspection, InZiv offers the REL, with fast and repeatable EL inspection, featuring high accuracy and proprietary non-damaging technology.